20/30 Solar™ Microspectrometer
The 20/30 Solar™ microspectrometer is designed for metrology and quality control testing of even the largest photovoltaic cells and their components. Built to your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for photovoltaic test and metrology processes. It is easy to use yet able to non-destructively measure reflectivity, transmissivity and film thickness of even sub-micron sized features. As such, the 20/30 Solar™ represents a giant leap forward in photovoltaic metrology and UV-visible-NIR microspectroscopy.
The 20/30 Solar™ microspectrophotometer combines the latest technologies to allow the user to measure transmissivity, reflectivity and thin film thickness of super strates and opaque substrates. Sampling areas can be as small as one micron. Three measurement techniques and all with the same instrument! The instrument includes CRAIC FilmPro™ thin film software and the option for automation. Additionally, the system can be equipped for UV and NIR imaging, in addition to spectroscopy, for such applications as contamination analysis of photovoltaic cells.
Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.
The 20/30 Solar™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.