20/30 Film™ Microspectrophotometer

20/30 Film: Small Spot Film Thickness Measurement System






Custom built, small spot film thickness system by transmission & reflectance



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The 20/30 Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to meet your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/30 Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.

The 20/30 Film™ microspectrophotometer combines the latest technologies to allow the user to measure thin film thickness of both opaque and transparent samples areas as small as one micron. And all with the same instrument! The instrument includes CRAIC FilmPro thin film software and the option for automation. Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their sample.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/30 Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.


Key Features*
  • Film thickness by transmission microspectroscopy
  • Film thickness by reflectance microspectroscopy
  • Raman Microspectroscopy
  • Colorimetry of microscopic sample areas
  • UV-visible-NIR fluorescence microspectroscopy
  • Polarization microspectroscopy in the UV, visible and NIR regions.
  • UV-visible-NIR transmission imaging
  • UV-visible-NIR reflectance imaging
  • UV-visible-NIR fluorescence micro-imaging
  • Polarization microscale imaging in the UV, visible and NIR regions
  • Manual or fully automated operation
  • Featuring Lightblades™ technology
  • Integrated TE cooled array detectors available for low noise and long term stability
  • Calibrated, variable measurement areas even smaller than a micron
  • Precision temperature control of samples
  • Superior images both with eyepieces and digital imaging
  • Specialized software including statistical analysis, spectral databasing, image analysis and more
  • Easy to use and maintain
  • From the experts in microspectroscopy

Film Thickness

Film thickness both by transmission & reflectance

A fully integrated microspectroscopy unit that features small spot film thickness measurements by both reflectance and transmission.  Now you can measure the thickness of multiple films on both transparent and opaque substrates.  This also means that you can measure even thicker films than previously possible.

Thin film interference spectrum on silicon

Small Spot Spectroscopy

Cutting edge microspectroscopy from the leaders

A fully integrated microspectroscopy unit that features a spectral range from the deep UV into the near infrared.  Simultaneous and direct imaging of both the sampling aperture and the sample makes for fast, accurate measurements.  Featuring Lightblades™ technology, the 20/30 Film™ gives you the ability to measure transmission, reflectance, polarization and fluorescence spectra of even sub-micron samples.

CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards.

Thin film interference spectrum on silicon

Raman Microspectroscopy

Flexible Raman Microspectroscopy

When fitted with the CRAIC Apollo™ Raman spectrometer module, the 20/30 Film™ is capable of Raman, resonance Raman and other types of measurements of microscopic samples. Modules include lasers, Raman spectrometers and the interface optics that allow you to collect high quality Raman spectra of your samples. Raman spectrum of Silicon with CRAIC Apollo™


High sensitivity emission microspectroscopy & imaging

The 20/30 Film™ can be configured for fluorescence and luminescence spectra and images of microscopic samples.  Featuring Lightblades™ technology and with excitation ranging from the deep UV to the near infrared and the ability to measure the emission in the same range, the 20/30 Film™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more.  Fluorescence Markers imaged with 20/20 PV™


  Microspectroscopy & imaging of UV-visible-NIR polarization

20/30 Film™ can be configured to acquire the polarization spectra and images of even the smallest samples.  Featuring Lightblades™ technology and with a spectral range from the UV to the NIR, the 20/30 Film™ polarization microspectroscopy capabilities are unparalleled.  The spectra and images of birefringent and other types of samples with polarization characteristics can be acquired quickly and easily with this sophisticated system. Polarization spectra of a blue dichroic fiber

Spectral Surface Mapping

Spectral Surface Mapping™

Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution.  3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated.

Spectral Surface Mapping™

UV-vis-NIR Microscopy

Superior image quality from the UV to the NIR

The 20/30 Film™ includes a unique UV-visible-NIR microscope with research grade optics.  Featuring high resolution digital imaging for color, UV and the NIR regions, the 20/30 Film™ has sophisticated imaging software.  This gives you the ability for both real time and image capture of samples by transmission, reflectance, polarization and fluorescence microscopy quickly and easily. UV microscope image of hard disk read write head


  • Thickness of coatings on stents
  • OLED Display and Lighting
  • Microdisplays
  • Flat Panel Color Masks
  • Semiconductor Film Thickness
  • MEMS devices
  • Films on Optical components


CRAIC Technologies provides service and support for it's instruments worldwide.  CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.

The 20/30 Film™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.

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The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 PV™, 20/30 Film™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.