20/30 Film™ Microspectrophotometer

20/30 Film: Small Spot Film Thickness Measurement System

 

 

 

 

 

Custom built, small spot film thickness system by transmission & reflectance

 

 

Contact CRAIC Today!

Introduction

The 20/30 Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to meet your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/30 Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.

The 20/30 Film™ microspectrophotometer combines the latest technologies to allow the user to measure thin film thickness of both opaque and transparent samples areas as small as one micron. And all with the same instrument! The instrument includes CRAIC FilmPro thin film software and the option for automation. Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their sample.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/30 Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.

The 20/30 Film™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.

Contact CRAIC Today!

The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 PV™, 20/30 Film™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.