20/20 FPD™ Microspectrophotometer

20/20 FPD™ for Flat Panel Display Metrology

 

 

 

 

Custom built for quality control of displays and lighting with microscopic spatial resolution

 

 

 

Contact CRAIC Today!
 

Introduction

The 20/20 FPD™ microspectrometer is designed for both R&D and quality control of the smallest features of flat panel displays...even the latest microdisplays with their micron scale pixels.  Built to your specifications, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy, automation and software to deliver the best performance for colorimetry, relative intensity comparisons, film thickness measurements and even contamination analysis.  All this in one easy-to-use device designed for non-destructive FPD analysis of micron sized features.  As such, the 20/20 FPD™ represents a giant leap forward in analytical tools for flat panel display development and metrology.

Individual pixels, especially with the latest microdisplays, are getting ever smaller.  Analysis of their color and light intensity requires a very sensitive instrument.  The 20/20 FPD™ is designed to measure on the micron scale and as such can not only analyze mura, but it can also compare the color and light intensity of individual pixels to one another.  In fact, the 20/20 FPD™ can measure such small areas that it can even map the color and intensity variation in a single pixel.  Combined with the ability to measure thin film thickness, contamination analysis capabilities, automation and touch screen control, the 20/20 FPD™ is the tool for analyzing the next generation of high resolution displays.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/20 FPD™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.

Features

Key Features*
  • Colorimetry (chromaticity) of micron scale areas
  • Comparative intensity measurements of micron scale areas
  • Luminance of micron scale areas
  • From large scale screens to advanced micro-displays
  • Film thickness by transmission microspectroscopy
  • Film thickness by reflectance microspectroscopy
  • Raman Microspectroscopy
  • Colorimetry of microscopic sample areas
  • UV-visible-NIR fluorescence microspectroscopy
  • Polarization microspectroscopy in the UV, visible and NIR regions.
  • UV-visible-NIR transmission imaging
  • UV-visible-NIR reflectance imaging
  • UV-visible-NIR fluorescence micro-imaging
  • Polarization microscale imaging in the UV, visible and NIR regions
  • Manual or fully automated operation
  • Integrated TE cooled array detectors for low noise and long term stability
  • Calibrated, variable measurement areas even smaller than a micron
  • Precision temperature control of samples
  • Superior images both with eyepieces and digital imaging
  • Specialized software including statistical analysis, spectral databasing, image analysis and more
  • Easy to use and maintain
  • From the experts in microspectroscopy

Micro Spot Colorimetry

Cutting edge microspectroscopy from the leaders

A fully integrated microspectroscopy unit that features a spectral range from the deep UV into the near infrared.  Simultaneous and direct imaging of both the sampling aperture and the sample makes for fast, accurate measurements.  The 20/20 FPD™ gives you the ability to measure color by transmission, reflectance and emission spectra of even sub-micron samples.

CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards.

Spectra of single pixels in OLED microdisplay

Film Thickness

Film thickness both by transmission & reflectance

A fully integrated microspectroscopy unit that features small spot film thickness measurements by both reflectance and transmission.  Now you can measure the thickness of multiple films on both transparent and opaque substrates.  This also means that you can measure even thicker films than previously possible.

Thin film interference spectrum on silicon

Raman Microspectroscopy

Flexible Raman Microspectroscopy

When fitted with the CRAIC Apollo™ Raman spectrometer module, the 20/20 FPD™ is capable of Raman, resonance Raman and other types of measurements of microscopic samples. Modules include lasers, Raman spectrometers and the interface optics that allow you to collect high quality Raman spectra of your samples. Raman spectrum of Silicon with CRAIC Apollo™

Emission Spectra

High sensitivity emission microspectroscopy & imaging

The 20/20 FPD™ can be configured for fluorescence and luminescence spectra and images of microscopic samples.  With excitation ranging from the deep UV to the near infrared and the ability to measure the emission in the same range, the 20/20 FPD™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more.  Fluorescence Markers imaged with 20/20 PV™

Polarization

  Microspectroscopy & imaging of UV-visible-NIR polarization

20/20 FPD™ can be configured to acquire the polarization spectra and images of even the smallest samples.  With a spectral range from the UV to the NIR, the 20/20 FPD™ polarization microspectroscopy capabilities are unparalleled.  The spectra and images of birefringent and other types of samples with polarization characteristics can be acquired quickly and easily with this sophisticated system. Polarization spectra of a blue dichroic fiber

UV-vis-NIR Microscopy

Superior image quality from the UV to the NIR

The 20/20 FPD™ includes a unique UV-visible-NIR microscope with research grade optics.  Featuring high resolution digital imaging for color, UV and the NIR regions, the 20/20 FPD™ has sophisticated imaging software.  This gives you the ability for both real time and image capture of samples by transmission, reflectance, polarization and fluorescence microscopy quickly and easily. UV microscope image of hard disk read write head

Applications

Applications
  • Microdisplays
  • OLED Displays & Lighting
  • LCD displays
  • LED displays & lighting
  • Color Masks
  • Film Thickness
  • Process Contaminant Identification

Support

CRAIC Technologies provides service and support for it's instruments worldwide.  CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.

The 20/20 FPD™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and emission from powered displays. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution color digital imaging system.

 Contact CRAIC Today!

The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/20 PV™, 20/20 FPD™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.