The innovative 20/30 XL™ microspectrophotometer is designed to allow you to acquire spectra, images, and film thickness measurements of microscopic features of large scale samples. "XL" stands for "extra large" and these are the types of samples for which this instrument was built. Built to meet your needs, the bespoke 20/30 XL™ incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities. The ease-of-use for which CRAIC instruments are known has even been improved, making this instrument the cutting edge of UV-visible-NIR microspectroscopy.
The 20/30 XL™ microspectrophotometer allows you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of features smaller than a micron across. Yet, depending upon the instrument configuration, the size of the sample can essentially be unlimited. Now you can map color varations within pixels of the biggest flat panel displays, measure film thickness of 300 mm wafers with ease or measure the fluorescence of the largest artworks.
Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.
The 20/30 XL™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.