Spectroscopy of microscopic areas of large samples

The 20/30 XL™ microspectrophotometer is designed to allow you to acquire spectra, images, and film thickness measurements of microscopic features of large scale samples.  "XL" stands for "extra large" and these are the types of samples for which this instrument was built.  Built to meet your needs, the bespoke 20/30 XL™ incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities. The ease-of-use for which CRAIC instruments are known has even been improved, making this instrument the cutting edge of UV-visible-NIR microspectroscopy.

The 20/30 XL™ microspectrophotometer allows you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and photoluminescent microspectra™ of features smaller than a micron across.  Yet, depending upon the instrument configuration, the size of the sample can essentially be unlimited.  Now you can map color variations within pixels of the biggest flat panel displays, measure film thickness of 300 mm wafers with ease or measure the fluorescence of the largest artworks.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.

The 20/30 XL™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.

Features

Key Features*

UV-visible-NIR, Raman and PL microspectra™ of large samples.

  • Microspot analysis of very large scale samples
  • Spectral Range: 200 to 2500 nm
  • UV-visible-NIR transmission microspectroscopy
  • UV-visible-NIR transmission imaging
  • UV-visible-NIR reflectance microspectroscopy
  • UV-visible-NIR reflectance imaging
  • UV-visible-NIR fluorescence microspectroscopy
  • UV-visible-NIR fluorescence micro-imaging
  • Raman microspectroscopy
  • UV-visible-NIR photoluminescence microspectroscopy
  • UV-visible-NIR photoluminescence imaging
  • Polarization microspectroscopy in the UV, visible and NIR regions
  • Polarization microscale imaging in the UV, visible and NIR regions
  • Thin film thickness measurements
  • Colorimetry of microscopic samples
  • Manual or fully automated operation
  • Featuring Lightbladestechnology
  • Integrated TE cooled array detectors available for low noise and long term stability
  • Precision temperature control of samples
  • Calibrated, variable measurement areas even smaller than a micron
  • Superior images both with eyepieces and digital imaging
  • Featured with Lambdafire™ spectroscopy and imaging control and analysis software.
  • Specialized software modules including statistical analysis, spectra mapping, spectral databasing, image analysis and more
  • Easy to use and maintain
  • From the experts in microspectroscopy

 

The 20/30 XL™ Microspectrometer can take spectra and images of microscopic samples from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra™ and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system.

 

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The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/30™, 20/30 PV™, 20/30 XL™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration. Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration. Specifications subject to change without notice.

UV-visible-NIR microscopes, UV-visible-NIR microspectrometers and Raman microspectrometers are general purpose laboratory instruments. They have not been cleared or approved by the European IVD Directive, the United States Food and Drug Administration or any other agency for diagnostic, clinical or other medical use.