CRAIC FilmPro™ Film Thickness Measurement Software

CRAIC Technologies Film Thickness Solutions


Sophisticated software for measuring small spot thin film thickness both in transmission and reflectance


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CRAIC Technologies™ has developed CRAIC Filmpro™ software for you to use with CRAIC instruments. When added to a CRAIC microspectrometer, CRAIC FilmPro™ is able to MEASURE the film thickness values of thin films by reflectance or transmittance. You can do this over microscopic areas the micron scale and with many different substrates. This allows you to ANALYZE not only thin films on substrates such as silicon, but also thin films on glass or quartz commonly found in flat panel displays. You will find the software very easy to use and reports can be printed and saved of any calculations. Additionally, automation packages can be added yielding the ability to automatically monitor film thickness variations over the surface of the sample.

CRAIC FilmPro™ is designed to control your CRAIC Technologies microspectrometer and allow you to acquire data and determine the thickness of thin films of microscopic areas in both transmission and reflectance.

Click here to learn more about the science of microspot thin film thickness measurements..


Key Features*
  • Modular software to plug in to Lambdafire™ microspectroscopy package.
  • Manual or fully automated control of CRAIC thin film thickness instruments.
  • Runs under Windows 7® and Windows 8®
  • Ability to calculate the thickness of multi-layer film stacks
  • Works with both transmission and reflectance data
  • Large library of films included with software
  • Large library of substrates included with software
  • Easily add more films and substrates
  • Easy to use and maintain
  • From the experts in microspectroscopy

Reflectance Film Thickness

Film thickness with opaque substrates

CRAIC FilmPro™ is able to run your CRAIC microspectrometer to acquire reflectance interference spectra quickly and easily.  

Using its large library of films and substrates, CRAIC FilmPro™ is then able to calculate the thickness of many types of films from the reflectance data precisely.

Silicon dioxide film on Silicon wafer

Transmission Film Thickness

Film thickness with transparent substrates

CRAIC FilmPro™ is able to run your CRAIC microspectrometer to acquire transmission interference spectra.   

As with reflectance spectra, CRAIC FilmPro™ can use its large libraries to calculate the thickness of many types of films from the transmission data quickly and easily.

Transmission image through silicon substrate


CRAIC Technologies provides service and support for it's instruments worldwide.  CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.

Perfect Vision for Science™



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CRAIC FilmPro™, the lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/30™, 20/30 PV™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

UV-visible-NIR microscopes, UV-visible-NIR microspectrometers and Raman microspectrometers are general purpose laboratory instruments. They have not been cleared or approved by the European IVD Directive, the United States Food and Drug Administration or any other agency for diagnostic, clinical or other medical use.