CRAIC Technologies™ QDI series microspectrophotometer tools allow for non-destructive and non-contact thin film thickness measurement of sub-micron sized areas in both reflectance and transmittance.  And they are not just limited to film thickness measurements: CRAIC QDI instruments can also measure polarization anisotropy, optical emissions and even fluorescence. These flexible tools are equally at home in the R&D laboratory, the fab floor or even the failure analysis facility.  Currently, CRAIC  solutions are used for film thickness measurement of semiconductors, LCD displays, OLED's, optical products, and medical devices.

CRAIC has integrated the small spot spectroscopic capabilities of its QDI series microspectrophotometer units with its QDI FilmPro™ software resulting in a flexible and powerful tool for thin film thickness measurement and more.  A CRAIC film thickness instrument can non-destructively MEASURE the spectra in both transmittance and reflectance of areas smaller than a micron...a very useful feature when measuring transparent substrates.  The software can then ANALYZE the spectra to determine the thickness of various films.  The QDI FilmPro™ software can also control automation features, such as stages, to make large numbers of repetitive measurements simple and accurately.  This can lead to development of high resolution maps across the surface of panels or wafers that show thickness variations with high spatial resolution.

We invite you to DISCOVER our revolutionary technologies that include a range of microspectrophotometers, UV and NIR microscopes, Raman microspectrometers, NIST Traceable Standards, microspectrophotometer accessories and software.  And our film thickness tools.  We further invite you to experience our exceptional service and technical support.