FLEX™ from CRAIC Technologies: a Flexible UV-visible-NIR Microspectrophotometer Concept

 

FLEX™ is designed as a multi-functional tool able to acquire micro-scale images and spectra from the deep UV to the NIR.  Offering transmission, reflectance, fluorescence, Raman as well as a host of other features, FLEX™ is a powerful addition to the laboratory. 

 

San Dimas, CA (January 1, 2015)-- CRAIC Technologies, the worlds leading innovator of UV-visible-NIR microspectroscopy solutions, is proud to introduce the FLEX™ UV-visible-NIR microspectrophotometer concept. FLEX™ is designed to be, as its name suggests, flexible in configuration, capabilities and pricing.  Tailored for cost effective spectroscopic analysis of many types of microscopic samples, FLEX™ operates from the deep ultraviolet to the near infrared.  Depending upon the configuration of FLEX™, samples can be analyzed by absorbance, reflectance, luminescence and fluorescence with high speed and accuracy. With FLEX™, you can also image microscopic samples directly with DirecVu™ optics and with high resolution color digital imaging. There are also a number of packages that can be added to allow you to measure everything from the refractive index of microscopic samples to thin film thickness.  Combined with CRAIC Technologies Traceable Standards, which are specifically designed for use with microspectrophotometers and calibrated using Standard Reference Materials from NIST, FLEX™ from CRAIC is built as a multi-functional tool for your laboratory and manufacturing facility. 

“CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. FLEX™ microspectrophotometer are built as good, cost effective solutions for everything from microscale spectroscopy, microcolorimetry and even thin film thickness measurements" states Dr. Paul Martin, President of CRAIC Technologies. “CRAIC Technologies microspectrophotometers are backed by years of experience designing, building and the using of this type of instrumentation for spectroscopic and image analysis.”

FLEX™ from CRAIC integrates a sensitive spectrophotometer, high resolution digital imaging, a UV-visible-NIR range microscope and easy-to-use software.  This powerful instrument is designed to acquire spectra and images from microscopic samples by absorbance, reflectance, fluorescence and emission.   With the high-resolution digital imaging, you are also able to store color photos of microscopic samples as you acquire their spectra.  Additional features such as the ability to measure thin film thickness or the refractive index can also be added.  Featuring a durable design, ease-of-use and multiple spectroscopic techniques, FLEX™ from CRAIC Technologies is more than just a scientific instrument…it is a new concept offering a superior solution for your analytical challenges.

For more information on the FLEX™ microspectrophotometer visit http://www.microspectra.com/products/flex.

About CRAIC Technologies: CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions.  CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise.  CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

Contact information:

CRAIC Technologies, Inc.

http://www.microspectra.com/

sales@microspectra.com
+1-310-573-8180

Spectral Surface Mapping with Microscopic Resolution

CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software.  This gives a user the ability to map the UV-visible-NIR absorbance, reflectance or fluorescence spectral response, point-by-point, with microscopic spatial resolution.

San Dimas, CA – October 28, 2014-- CRAIC Technologies, the world leading innovator of microanalysis solutions, is proud to announce Spectral Surface Mapping™ (S2M™) capabilities for its UV-visible-NIR microspectrophotometers. S2M™ gives CRAIC microspectrometer users the ability to map the spectral responses across of surfaces of their samples  point-by-point.  With microscopic spatial resolution, surface profiles can be created using UV-visible-NIR transmission, absorbance, emission, fluorescence and polarization microspectral data. S2M™ can even create maps from Raman microspectral data from the CRAIC Apollo™ Raman microspectrometer. CRAIC microspectrometers can now created highly detailed spectral maps with micron scale resolution rapidly and automatically.

“CRAIC Technologies has worked to develop the Spectral Surface Mapping™ package because of customer requests. Our customers wanted the ability to automatically survey and characterize the entire surface of samples by their spectral characteristics. They also wanted a high spatial resolution” states Dr. Paul Martin, President of CRAIC Technologies. “The S2M™ package does just that. It allows you to collect spectral data from thousands of points with a user defined mapping pattern. And because our customers deal with so many different types of microspectroscopy, we gave S2M™ the ability to map UV-visible-NIR transmission, absorbance, reflectance, and even emission microspectra™ all with the same tool.”

Spectral Surface Mapping™ is a plug-in software module used with CRAIC Technologies Lambdafire™ microspectrometer software. When employed with CRAIC Technologies microspectrometers with programmable stages, S2M™ allows a user to automatically take spectral measurements with user-defined mapping patterns that reach to the movement limits of the stage itself. With the ability to measure up to a million points, high definition maps of the spectral response of the surface of a sample may be generated. And because of the flexibility and power of the software, the maps may be from transmission, absorbance, reflectance, fluorescence, emission and even polarization data. Raman spectral responses may even be collected and mapped when used with CRAIC Technologies Apollo™ Raman microspectrometers. S2M™ gives even more power to the scientist and engineer to study the entire surface of their samples by several different methods and in the highest level of detail.

For more information about Spectral Surface Mapping™ capabilities of CRAIC Technologies microspectrometers, visit www.microspectra.com .

About CRAIC Technologies: CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

Contact information:

CRAIC Technologies, Inc.

http://www.microspectra.com/

sales@microspectra.com

+1-310-573-8180

Microspot Thin Film Thickness Measurements by Transmission and Reflectance Microspectroscopy

 

CRAIC FilmPro™ software is used with CRAIC Technologies microspectrometers to measure the thickness of thin films of microspot areas in both reflectance and transmission.

San Dimas, CA (October 9, 2014)– CRAIC Technologies, a leading innovator of UV-visible-NIR microanalysis solutions, is proud to introduce CRAIC FilmPro™ film thickness measurement software.  This software package is designed to plug-in to CRAIC Technology’s microspectrophotometers and their controlling Lambdafire™ software.  CRAIC FilmPro™ allows the user to measure the thickness of thin films rapidly and non-destructively.  Able to analyze films of many materials on both transparent and opaque substrates, CRAIC FilmPro™ enables the user to determine thin film thickness on everything from semiconductors, MEMS devices, disk drives to flat panel displays.  This powerful and flexible software can be used in many different fields and in everything from research to industrial settings.

"Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products.  CRAIC FilmPro™ is a plug-in module that can be added to a CRAIC Technologies microspectrophotometer to enable this capability.  This software was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates.  CRAIC Technologies microspectrophotometers equipped with CRAIC FilmPro™ meets those needs" says Dr. Paul Martin, President. 

The complete CRAIC Technologies microspot film thickness solution combines an advanced microspectrophotometer with the sophisticated CRAIC FilmPro™ software.  This software is a plug-in module to CRAIC Technologies Lambdafire instrument control software.  It enables the user to measure film thickness by either transmission or reflectance of many types of materials and substrates.  Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron.  Designed for both research and the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data.  With the addition of spectral mapping from CRAIC Technologies, film thickness maps of entire devices can be created.

For more information on the CRAIC FilmPro™ microspot film thickness measurement software and CRAIC Technologies microspot film thickness tools, visit www.microspectra.com.

About CRAIC Technologies: CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions.  CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise.  CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

Contact information:

CRAIC Technologies, Inc.

http://www.microspectra.com/

sales@microspectra.com

+1-310-573-8180

One Instrument for Raman, UV-Visible-NIR and Fluorescence Spectroscopy of Microscopic Samples

The 20/30 PV™ gives you the ability to collect UV-visible-NIR absorbance, reflectance, fluorescence and Raman spectra of microscopic sample areas. This is in addition to UV-visible-NIR imaging, film thickness measurements and micro-colorimetry.

San Dimas, CA (September 1, 2014)-- CRAIC Technologies, the world leading innovator of microspectroscopy solutions, has added Raman microspectroscopy to its flagship product: the 20/30 Perfect Vision™ microspectrophotometer . Users of the 20/30 PV™ now have the ability to acquire Raman spectra, with multiple laser wavelengths, in addition to UV-visible-NIR absorbance, reflectance, fluorescence and emission microspectra™. The 20/30 PV™ is able to acquire all these types of spectra micron scale samples rapidly and easily. Better yet, the 20/30 PV™ is able to acquire all these spectra from the same area because it features CRAIC Technologies proprietary optical aperturing technology. Additionally, the 20/30 PV™ features the ability to acquire images of these same microscopic samples in the UV, visible and NIR regions. The applications for such a multi-purpose instrument are numerous. For example, the 20/30 PV™ is used to develop the latest advanced materials, such as graphene and carbon nanotubes, to studying various types of biological samples, including lignins and nanocrystalline cellulose, to the analysis of forensic samples and the measurement of thin film thickness in the semiconductor industry. Giving this instrument the ability to analyze the Raman spectra of microscopic samples in addition to UV-visible-NIR and fluorescence microspectroscopy makes the 20/30 PV™ the cutting-edge micro-analysis tool for any laboratory or manufacturing facility.

“CRAIC Technologies has long been an innovator in the field of UV-visible-NIR microanalysis. We have helped to advance the field of microscale analysis by constantly developing new instrumentation as well as with research and teaching. Adding Raman microspectroscopy capabilities to our leading edge 20/30 PV™ microspectrophotometer makes it the ideal tool for the laboratory or process environment as it packs so many capabilities into one unique tool” states Dr. Paul Martin, President of CRAIC Technologies. “The 20/30 PV™ is now able to acquire vibrational spectra in addition to UV-visible-NIR spectra and images. And using CRAIC Technologies proprietary optical technology, the Raman, UV-visible-NIR and luminescence spectra are all from the same area. The ability to acquire spectra using multiple techniques and of the same microscopic target area represents a strong advantage for the 20/30 PV™ microspectrophotometer.”

The 20/30 PV™ microspectrophotometer is a self-contained unit that features advanced UV-visible-NIR light sources, solid state lasers, true UV-visible-NIR microscopy, sensitive Lightblades™ spectrometers and sophisticated Lambdafire™ spectral and imaging software. Raman microspectroscopy is added with the Apollo™ Raman microspectroscopy packages. Each Apollo™ is a self contained package including laser, spectrometer and hardware.  All these capabilities can be integrated into the cutting-edge 20/30 PV™ microspectrophotometer and give you multiple methods to analyze microscopic samples rapidly and easily. With its Raman, UV-visible-NIR spectroscopic and imaging capabilities, durable design, ease-of-use and the experience of CRAIC Technologies in microanalysis, the 20/30™ microspectrophotometer is more than just a scientific instrument…it is a solution to your most challenging analytical questions.

For more information about the 20/30 Perfect Vision™ microspectrophotometer now offered with Raman microspectroscopy, visit http://www.microspectra.com/.


About CRAIC Technologies:CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

Contact information:

CRAIC Technologies, Inc.

http://www.microspectra.com/

sales@microspectra.com
+1-310-573-8180

CRAIC Technologies Website: A Resource for UV-Visible-NIR and Raman Microspectroscopy

 

The inclusion of extensive scientific and technical materials relating to UV-visible-NIR and Raman imaging and spectroscopy of microscopic features makes CRAIC Technology’s website a unique resource for many fields.

San Dimas, CA (August 1, 2014)-- CRAIC Technologies, the world’s leading innovator of UV-visible-NIR and Raman micro-analysis solutions, is pleased to Microspectrometerannounce several updates to its website at www.microspectra.comThese include a substantial amount of detailed technical information on both microscopy and microspectroscopy in the Technical Support section.  The multi-lingual website also provides many new features such as customer forums and enhanced search capabilities.

“CRAIC Technologies possesses many years of experience in UV-visible-NIR and Raman microscopy, spectroscopy and micro-scale spectroscopy.  We also have extensive experience in many of the fields that utilize our instruments” states Dr. Paul Martin, President of CRAIC Technologies.  “As a service oriented company, we are happy to share our knowledge with others.  We intend to have our website serve as a resource in the fields of microscopy and spectroscopy.”   

The CRAIC Technologies website www.microspectra.com now contains extensive amounts of technical and scientific information that is available to visitors under the technical support section.  This includes information on the science behind microscopy, spectroscopy and microspectroscopy as well as commonly used formulas.  Additionally, visitors may register for access to CRAIC Technologies extensive publications archive and customer forums.  Detailed service and technical support information are also available to registered CRAIC Technologies customers. 

About CRAIC Technologies:CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions.  CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise.  CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.

Contact information:

CRAIC Technologies, Inc.

http://www.microspectra.com/

sales@microspectra.com
+1-310-573-8180