20/30 XL Film™ Thickness Measurement with Raman
The 20/30 XL Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to your specifications, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/30 XL Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.
The 20/30 XL Film™ microspectrophotometer combines the latest technologies to allow the user to measure thin film thickness of both opaque and transparent samples areas as small as one micron. And all with the same instrument! The instrument includes CRAIC FilmPro™ thin film software and can be operated manually or be fully automated. Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their sample.
Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.
The 20/30 XL Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.