20/30 XL Film™ Thickness Measurement  with Raman

2030 XL Film™ Thickness Measurement Tool with Raman Spectroscopy





Custom built, small spot film thickness measurement tool for large samples offering Raman



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The 20/30 XL Film™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.
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The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/30™, 20/30 XL™, 20/30 XL Film™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations. 

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.