20/30 Forensic™ Microspectrophotometer

20/30 Forensic Microspectrophotometer

 
 

 

 

The leading multifunctional tool for analyzing fibers, paints, glass & documents.

 

 

 

Contact CRAIC Today!

 

 

Introduction


The 20/30 Forensic™ microspectrometer from CRAIC Technologies is designed for forensic analysis with superior results. This bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance microspectroscopy of trace evidence and questioned documents. It is easy to use yet able to non-destructively spectrally analyze features ranging from sub-micron to over a 100 microns across. As such, the 20/30 Forensic™ represents a giant leap forward in forensic microspectroscopy and document examination.

The 20/30 Forensic™ microspectrophotometer combines the latest technologies to allow the user to measure UV-visible-NIR range transmission, absorbance, reflectance and fluorescence spectra of samples as small as one micron. And all with the same instrument! Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their evidence.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.

The 20/30 Forensic™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.

The 20/30 Forensic™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit octoganal optical head are both trademarks of CRAIC Technologies, Inc.


Contact CRAIC Today!

 The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 Forensic™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

20/30 Forensic™ Microspectrophotometer

 

20/30 Forensic Microspectrophotometer

 
 

 

 

The leading multifunctional tool for analyzing fibers, paints, glass & documents.

 

Contact CRAIC Today!

 

 

Introduction

The 20/30 Forensic™ microspectrometer from CRAIC Technologies is designed for forensic analysis with superior results. This bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance microspectroscopy of trace evidence and questioned documents. It is easy to use yet able to non-destructively spectrally analyze features ranging from sub-micron to over a 100 microns across. As such, the 20/30 Forensic™ represents a giant leap forward in forensic microspectroscopy and document examination.

The 20/30 Forensic™ microspectrophotometer combines the latest technologies to allow the user to measure UV-visible-NIR range transmission, absorption, reflectance and fluorescence spectra of samples as small as one micron. And all with the same instrument! Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their evidence.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.

The 20/30 Forensic™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.

The 20/30 Forensic™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit octoganal optical head are both trademarks of CRAIC Technologies, Inc.


Contact CRAIC Today!

 The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 Forensic™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

20/30 Film™ Microspectrophotometer

20/30 Film: Small Spot Film Thickness Measurement System

 

 

 

 

 

Custom built, small spot film thickness system by transmission & reflectance

 

 

Contact CRAIC Today!

Introduction

The 20/30 Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to meet your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/30 Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.

The 20/30 Film™ microspectrophotometer combines the latest technologies to allow the user to measure thin film thickness of both opaque and transparent samples areas as small as one micron. And all with the same instrument! The instrument includes CRAIC FilmPro thin film software and the option for automation. Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their sample.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/30 Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.

The 20/30 Film™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.

Contact CRAIC Today!

The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 PV™, 20/30 Film™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

20/30 Film™ Microspectrophotometer

 

20/30 Film: Small Spot Film Thickness Measurement System

 

 

 

 

 

Custom built, small spot film thickness system by transmission & reflectance

 

Contact CRAIC Today!

Introduction

The 20/30 Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to meet your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/30 Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.

The 20/30 Film™ microspectrophotometer combines the latest technologies to allow the user to measure thin film thickness of both opaque and transparent samples areas as small as one micron. And all with the same instrument! The instrument includes CRAIC FilmPro thin film software and the option for automation. Additionally, the samples are viewed simultaneously during microspectral data acquisition. This allows the user to visually and spectroscopically locate and analyze their sample.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/30 Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.

The 20/30 Film™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.

Contact CRAIC Today!

The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/30 PV™, 20/30 Film™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

20/30 Solar™ Microspectrometer

20/20 Solar™ Photovoltaic Testing System

 

 

 

Custom built for metrology and quality control of large photovoltaic cells

 

 

Contact CRAIC Today!

Introduction


The 20/30 Solar™ microspectrometer is designed for metrology and quality control testing of even the largest photovoltaic cells and their components.  Built to your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for photovoltaic test and metrology processes.  It is easy to use yet able to non-destructively measure reflectivity, transmissivity and film thickness of even sub-micron sized features. As such, the 20/30 Solar™ represents a giant leap forward in photovoltaic metrology and UV-visible-NIR microspectroscopy.

The 20/30 Solar™ microspectrophotometer combines the latest technologies to allow the user to measure transmissivity, reflectivity and thin film thickness of super strates and opaque substrates.  Sampling areas can be as small as one micron. Three measurement techniques and all with the same instrument! The instrument includes CRAIC FilmPro™ thin film software and the option for automation. Additionally, the system can be equipped for UV and NIR imaging, in addition to spectroscopy, for such applications as contamination analysis of photovoltaic cells.

Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.

The 20/30 Solar™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.

The 20/20 Solar™ Microspectrometer can take spectra and images from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and luminescence. The microspectrometer is offered with both the DirecVu™ to view samples by eye as well as with a high resolution UV-visible-NIR digital imaging system. The lit blue base and lit hexagonal optical head are both trademarks of CRAIC Technologies, Inc.

Contact CRAIC Today!

The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/20 Solar™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.