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QDI FilmPro™ Film Thickness Software   CRAIC Technologies™ has developed QDI Filmpro™ software for you to use with CRAIC instruments. When added to a CRAIC microspectrometer, QDI FilmPro™ is able to MEASURE the film thickness values of thin films by reflectance or transmittance. You can do this over microscopic areas the micron scale and with many different substrates. This allows you to ANALYZE not only thin films on substrates such as silicon, but also thin films on glass or quartz commonly found in flat panel displays. You will find the software very easy to use and reports can be printed and saved of any calculations. Additionally, automation packages can be added yielding the ability to automatically monitor film thickness variations over the surface of the sample.
We invite you to DISCOVER our revolutionary technologies that include a range of microspectrometers, UV-visible-NIR microscopes, Raman microspectrometers, NIST Traceable Standards, microspectrometer accessories and software. We further invite you to experience our exceptional service and technical support. |
