Micro-scale analysis of color, relative intensity and thin film thickness
The QDI 302 FPD™ Microscope Spectrophotometer is designed to add optical metrology and imaging to your microscope or probe station. It can be configured to measure transmittance, reflectance and emission from flat panel display components or fully assembled units. With it's software, the QDI 302 FPD™ can analyze the spectral characteristics, the thickness of thin films and the colorimetry of mura, single pixels and even within pixels. All this can be done with a single QDI 302 FPD™ microscope spectrophotometer and a microscope.
With no moving parts, the QDI 302 FPD™ is durable and user friendly. Designed with flexibility in mind, it finds many uses in the metrology of flat panel display parts and completed units. This makes the QDI 302 FPD™ microscope spectrophotometer vital to the production line.
The QDI 302™ Microscope Spectrophotometer can be configured to acquire spectra from the deep ultraviolet to near infrared. It can be added to a probe station to acquire spectra and images in absorbance, reflectance, and fluorescence. The lit hexagonal optical head is a trademark of CRAIC Technologies, Inc.
- Flat Panel Color Masks
- Flat Panel LEDs
- OLEDs
- MEMS devices
- Semiconductors
- Optical Film Thickness
- Process Contamination Analysis
- TE cooled array detector for low noise and long term stability
- Total spectral range from deep UV to NIR with the specific range selected by the user
- High dynamic range & sensitivity
- Variable measurement areas down to sub-micron
- Upgrade your old microspectrophotometer with modern hardware and software
- Incorporates high resolution digital imaging...up to 6 megapixels
- Hardware including automation and specialized analysis packages
- Software including specialized data analysis, databasing and imaging.
 
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