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MINERVA Micropectrometer Software
MINERVA Microspectrometer Software

 





Sophisticated software for microspectrophotometer control and spectral analysis


 

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Introduction

CRAIC Technologies™ MINERVA™ spectral analysis software empowers users of CRAIC Technology's microspectrophotometers with instrument control, microspectra™ acquisition and spectral analysis functions

Running under Windows 7™ or Windows XP™, MINERVA™ gives you full control of CRAIC microspectrophotometers as well as the ability to acquire high quality spectra of microscopic samples by absorbance, reflectance or fluorescence and then to analyze those microspectra™.  Designed for the production environment as well as the laboratory, it incorporates many types of sophisticated tools for analyzing spectra. It also has two modes of operation: a production level with recipe driven instrument control and data analysis in addition to a password protected engineering mode with the flexibility for advanced research and for creating those recipes.

Features

Key Features*
  • MINERVA-64™ now available for 64-bit processors!
  • MINERVA™ for 32-bit processors also available.
  • Runs under Windows 7® and Windows XP®
  • Microspectrophotometer Control and Data Analysis in one easy-to-use package
  • Microspectrophotometer automation control and programming
  • Perfect for research as well as production with password protected engineering modes and defined recipes for users
  • Many plug-in modules available such as thin-film thickness, colorimetry and more.
  • Easy to use and maintain
  • From the experts in microspectroscopy

Microspectrometer Control

Complete instrument control

MINERVA™ is software for complete control of your CRAIC Technologies microspectrophotometer.  Designed to be modular, the software offers many different features for instrument control.  This includes operation of both manual or fully automated microspectrophotometers and much more. 

MINERVA™ also features automatic calibration checking with CRAIC Technologies NIST traceable microspectrometer standards.

 Thin film interference spectrum on silicon

Spectral Analysis

Sophisticated Spectral Analysis

MINVERA™ software is designed to be modular and therefore can be configured with whatever data analysis features you need.  Features include statistical analysis, advanced thin film thickness measurements, micro-colorimetry and more.  Report generation is also easily customizable and can even be cut and pasted into common word processing programs. Raman spectrum of Silicon with CRAIC Apollo™

Support

CRAIC Technologies provides service and support for it's instruments worldwide.  CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.


Perfect Vision for Science™

 

 

Contact CRAIC Today!
 

MINERVA™, CRAIC MINERVA™, MINERVA II™, CRAIC MINERVA II™, the lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 20/20™, 20/20 PV™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.

UV-visible-NIR microscopes, UV-visible-NIR microspectrometers and Raman microspectrometers are general purpose laboratory instruments. They have not been cleared or approved by the European IVD Directive, the United States Food and Drug Administration or any other agency for diagnostic, clinical or other medical use.