UV-vis-NIR Microspectrometers
UV-visible-NIR microspectrophotometer: an instrument designed to measure the UV-visible-NIR spectra of microscopic samples by transmittance, reflectance, polarization, fluorescence, and other types of luminescence. With specialized software, they can be used to measure thin film thickness, colorimetry and more. The following links have more information:
UV-vis-NIR Microscope Photometers
UV-visible-NIR microscope photometers: an instrument designed to measure the UV-visible-NIR spectra of microscopic samples by transmittance, reflectance, polarization, fluorescence, and other types of luminescence. With specialized software, they can be used to measure thin film thickness, colorimetry and more. The following links have more information:
UV Microscopes
UV microscope: CRAIC Technologie UV microscope systems allow the user to image items that cannot be seen with commonly available microscopes that only cover the visible range. This capability is useful in diverse fields such as a protein crystal analysis for drug discovery to contamination control for semiconductors to interior circuits in bonded silicon devices. The following links contain more information:
NIR Microscopes
NIR microscope: CRAIC Technologies SWIR microscope or NIR microscope systems allow the user to image items that cannot be seen with commonly available microscopes that only cover the visible range. This capability is useful in diverse fields such as a protein crystal analysis for drug discovery to contamination control for semiconductors to interior circuits in bonded silicon devices. The following links contain more information:
Raman Microspectrometers
Raman microspectrometer: an instrument designed to measure the Raman spectra of microscopic samples. The following links contain more information about CRAIC Technologies Raman microspectrometer solutions:
Micro-Colorimetry
Microcolorimetry is colorimetry of microscopic samples or the determination of color spaces of microcopic samples.
Microspot Film Thickness Measurement
Thin Film Thickness Measurement: microspectrophotometers use interferometry to measure the thickness of films deposited on surfaces. This can be done either by transmission through the film or reflectance off of it: