CRAIC Technologies Film Thickness Measurement

QDI FilmPro Thin Film Thickness Measurement Software

CRAIC Technologies™ has developed QDI Filmpro™ software for you to use with CRAIC instruments. When added to a CRAIC microspectrometer, QDI FilmPro™ is able to MEASURE the film thickness values of thin films by reflectance and transmittance. You can do this down to sub-micron microscopic areas and with many different substrates. This allows you to ANALYZE thin films on traditionally opaque substrates such as silicon as well as thin films on glass or quartz...even films commonly found in flat panel displays. You will find the software very easy to use and reports can be printed and saved of any calculations. Additionally, full automation packages can be added to the system giving it the ability to automatically monitor film thickness variations over the surface of the sample.

We invite you to DISCOVER our revolutionary technologies that include a range of microspectrometers, UV-visible-NIR microscopes, Raman microspectrometers, NIST Traceable Standards, microspectrometer accessories and software. We further invite you to experience our exceptional service and technical support.

The QDI FilmPro™ Software can measure thin film thickness of many types of films and on many types of substrates. Thin film thickness can be measured in both transmittance and reflectance. QDI FilmPro™ is a trademark of CRAIC Technologies, Inc.


	Applications		Key Advantages

Metrology R&D of new films and devices Semiconductors OLED LED LCD Optical coatings Biofilms		Deep UV to NIR microspectroscopy for greater range of thickness measurement Transmittance and Reflectance for greater flexibility Large number of films already in software Large number of substrates already in software User can add new films and substrates to software Store both spectra and film thickness values Easy to use and maintain