SWIR Microscopy
SWIR Microscopy is microscopy for imaging in the shortwave infrared region.
SWIR microscopes are designed to "see" beyond what a standard optical microscope can image. With special SWIR optics, light sources and cameras, SWIR microscopy is for imaging microscopic samples in the visible and the shortwave infrared region. This means that SWIR microscopes have features that make them superior to normal visible range microscopes:
- Some materials are transparent in the SWIR while being opaque in the visible region
- Enhanced contrast of certain materials in the SWIR region.
For example, silicon is opaque under normal light but is transparent in the SWIR region. The interiors of silicon based devices can therefore be inspected without having to disassemble them.
CRAIC Technologies offers a number of solutions for the shortwave infrared microscope. These custom designed microscopes capable of imaging from the visible region all the way into the shortwave infrared. They are capable of microscopy in transmission, reflectance and even fluorescence.
Learn more about SWIR microscopy:
