308 PV™ Microscope Spectrophotometer

308 PV™ Microscope Spectrophotometer

 





Spectroscopy, colorimetry and micro spot film thickness on a budget.


 

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Introduction

The 308 PV™ Microscope Spectrophotometer is a manual system designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.  And for a very attractive price.

The 308 PV™ attaches to an open photoport and enables you to collect transmission, reflectance, polarization or even fluorescence and luminescence spectra of microscopic samples.  Featuring Lightblades™ spectrophotometer technology from CRAIC, the 308 PV™ spectrophotometer has a usable spectral range from the ultraviolet to the near infrared.  Featuring a proven, all manual design, the 308 PV™ offers a low cost of ownership while allowing you to acquire high quality spectra of micron-scale samples.

The 308 PV™ Microscope Spectrophotometer is ideal for diverse applications such as colorimetry of pixels on flat panel displays, reflectometry of vitrinite coal and source rock, or thin film thickness measurements of optics and semiconductors. The 308 PV™is also a cost effective way to upgrade older microspectrometers to the latest hardware and software.

Features

Key Features*
  • Featuring Lightblades™ spectrophotometers designed specifically for microspectroscopy
  • User selected spectral range from deep UV to NIR
  • 250 to 1000 nm available spectral range
  • Permanently calibrated, variable measurement areas available.
  • Thermoelectric cooling available to improve signal-to-noise ratios and long term stability.
  • Incorporates high resolution, color digital imaging...up to 5 megapixels available
  • Advanced Lambdafire™ spectral and image analysis software
  • Transmission microspectroscopy
  • Reflectance microspectroscopy
  • Fluorescence microspectroscopy
  • Polarization microspectroscopy
  • Thin film thickness measurements
  • Colorimetry of microscopic samples.
  • Refractive index measurements with the rIQ™ package.
  • Manual or fully automated operation
  • Precision temperature control of samples
  • Specialized software including statistical analysis, spectral databasing, image analysis and more
  • NIST traceable microspectrometer standards
  • Easy to use and maintain
  • From the experts in microspectroscopy

UV-vis-NIR Microspectroscopy

Adding spectroscopy to your microscope™

The 308 PV™ is a spectrophotometer, incorporating an imaging system, designed to add to any microscope with a photoport.  Configurable for work ranging from the UV through the visible and into the near infrared, this powerful tool gives your systems new capabilities including film thickness measurements and colorimetry.  Featuring Lightblades™ technology, the 308 PV™ also allows you the ability to measure transmission, reflectance, polarization and fluorescence spectra of micron-scale samples.

Emission spectra of OLED pixels

Fluorescence

Cutting edge microfluorometry

The 308 PV™ can be configured for fluorescence and luminescence spectroscopy of even sub-micron samples.  Featuring Lightblades™ technology and with the ability to measure the fluorescence and luminescence from the UV to the NIR, the 308 PV™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more.  Fluorescence threads in currency

Polarization

  Polarization Microspectroscopy

The 308 PV™ can be configured to acquire the polarization spectra of microscopic samples.  Featuring Lightblades™ technology, the 308 PV™ polarization microspectroscopy capabilities allow you to acquire spectra of birefringent and other types of samples quickly and easily. Polarization spectra of a blue dichroic fiber

Spectral Surface Mapping


Spectral Surface Mapping™

Combines hardware and software for automated spectral analysis and 5D mapping of samples with microscopic spatial resolution.  3D maps of the absorbance, transmission, reflectance and emission spectra of samples may be generated.

Spectral Surface Mapping™

Imaging & Microscopy

High resolution color digital imaging

The 308 PV™ features high resolution, color digital imaging with sophisticated software.  It allows you to simultaneously see both the spectrophotometer entrance aperture and the sample.  This makes it very easy to align the sample for measurements and to capture full color images under any measurement conditions.  OLED Pixels with 308 PV spectrophotometer aperture

Applications

Applications

  • Add spectroscopy to a microscope
  • Add thin film thickness measurements to a probe station
  • Upgrade an older microspectrophotometer
  • Colorimetry of LCD and OLED displays
  • Vitrinite reflectance of coal, coke and petroleum source rock
  • Surface Plasmon Resonance development
  • Biotechnology research

Support

CRAIC Technologies provides service and support for it's instruments worldwide.  CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.

The 308 PV™ Microscope Spectrophotometer can be configured to acquire spectra from the deep ultraviolet to the near infrared. It can be added to a microscope to acquire spectra and images in absorbance, reflectance, and fluorescence.
 
Perfect Vision for Science™

 

 

Contact CRAIC Today!
 

UV-visible-NIR microscopes, UV-visible-NIR microspectrometers and Raman microspectrometers are general purpose laboratory instruments. They have not been cleared or approved by the European IVD Directive, the United States Food and Drug Administration or any other agency for diagnostic, clinical or other medical use. 

The lit octagonal optical head is a trademark of CRAIC Technologies, Inc. CRAIC Technologies, 308™, 308 PV™ and "Perfect Vision for Science" are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration.  Features listed here may not be present in some configurations.

*Features and specifications depend upon instrument configuration.  Specifications subject to change without notice.