CRAIC Technologies Solutions

 
The Challenge The Solution The Paper
Rapid and accurate metrology of OLED displays for color, intensity and mura

Microspectral analysis of the displays and their components

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Locating protein crystals after formation in solution A UV microscope equipped to selectively image the protein crystals This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Determination of protein crystal purity while still in solution An ultraviolet microspectrophotometer to locate and spectroscopically identify and analyze the purity of the crystals This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Measure vitrinite reflectance in coal per ISO 7404 and ASTM D2798 standard methods A microspectrophotometer with appropriate software, standards and microscope This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Measuring surface plasmon resonance on the microscopic scale A UV-visible-NIR microspectrophotometer with high magnification This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Rapid and accurate metrology of liquid crystal displays for color, intensity and mura

Microspectral analysis of the LCD displays and their components

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Rapid and non-destructive internal inspection of bonded silicon devices

NIR microscopy at various wavelengths to find voids, cracks, and more.

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