CRAIC Technologies Introduces 508PV™ Microscope Spectrophotometer with Advanced Technology Updates for Display Applications

San Dimas, CA – [October 14, 2025] — CRAIC Technologies, a global leader in UV-Visible-NIR microspectroscopy solutions, today announced new technology updates to the 508PV™ Microscope Spectrophotometer, a system designed to add advanced spectroscopic measurement capabilities directly to optical microscopes. With these updates, the 508PV™ offers display engineers and manufacturers an unmatched tool for analyzing pixels, films, and coatings at the microscopic level.

CRAIC Technologies Introduces Updated 508PV™ Microscope Spectrophotometer for Semiconductor Metrology

San Dimas, CA - [January 29, 2026] - CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV™ Microscope Spectrophotometer, designed to meet the precision demands of semiconductor fabs and R&D laboratories. The 508PV™ seamlessly adds full spectroscopic measurement capabilities to optical microscopes and probe stations, making it an indispensable tool for advanced semiconductor inspection and process control.

Bringing Spectroscopy to Semiconductor Microscopy

The 508PV™ integrates directly with standard upright or inverted microscopes, converting them into microspectrophotometers capable of measuring transmission, reflectance, fluorescence, photoluminescence, and polarization spectra from microscopic structures. With these updates, the system provides fabs with critical insights into:

• Film Thickness & Uniformity — Non-destructive mapping of thin film stacks, AR coatings, and dielectric layers down to nanometer precision.

• Wafer-Scale Measurements — Characterization of coatings, contamination, or defects on 200 mm and 300 mm wafers with automated high-throughput sampling.

• Device-Level Analysis — Measurement of single transistors, interconnects, MEMS devices, and patterned features with sub-micron spot sizes.

• Broad Spectral Coverage — From deep UV (~250 nm) through near-infrared (~2100 nm), covering the full range required for semiconductor optics and materials.

• Integrated Imaging — High-resolution color imaging combined with precise spectroscopic apertures ensures accurate sample targeting and documentation.

• Automation & Reliability — Thermoelectrically cooled detectors, permanent aperture calibration, and CRAIC’s Lambdafire™ software ensure repeatable results with minimal operator intervention.

Supporting Advanced Semiconductor Manufacturing

As semiconductor devices continue to shrink in size and increase in complexity, precise optical and spectroscopic analysis at the microscale has become critical. The 508PV™ enables fabs to enhance yield, monitor process stability, and accelerate R&D with a flexible, microscope-based platform.

“With the 508PV™, semiconductor engineers can now extract high-quality spectral data from the smallest device features directly through their existing microscopes and probe stations,” said Dr. Paul Martin, President of CRAIC Technologies. “This system delivers the precision, flexibility, and automation that fabs require for next-generation device development and high-volume manufacturing.”

Availability

The CRAIC 508PV™ Microscope Spectrophotometer is available immediately and can be configured for both R&D labs and semiconductor fabs, with options for wafer-scale mapping, thin film metrology, and automated QA workflows. For more information or to request a demonstration, please visit:
www.microspectra.com/products/508-pv-microscope-microspectrophotometer

About CRAIC Technologies

CRAIC Technologies, Inc. develops advanced instrumentation for UV-Visible-NIR and Raman microspectroscopy. With decades of experience supporting research, manufacturing, and quality assurance, CRAIC delivers innovative optical solutions for semiconductors, displays, materials, and life sciences.

Perfect Vision for Science™

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For Immediate Release

CRAIC Technologies Announces Lambdafire™ 2.0 — Next-Generation Spectroscopy Software for Microscale Analysis

CRAIC Technologies, a global leader in UV-visible-NIR and Raman microspectroscopy solutions, is proud to announce the release of Lambdafire^™ 2.0, the next-generation software platform engineered for advanced control, data acquisition, and spectral analysis in microspectrophotometry.  

Designed to optimize performance across CRAIC’s full line of microspectrophotometers, Lambdafire^™ 2.0 delivers an intuitive, customizable, and powerful environment for researchers, engineers, and QA professionals working with microscale samples.

Powerful New Features for Spectral and Imaging Excellence

Lambdafire^™ 2.0 is a 64-bit Windows-native application built for precision, flexibility, and high-throughput performance. Key features include:

• Comprehensive Instrument Control

Full control of all CRAIC microspectrometers, including manual and automated operation, real-time hardware feedback, and automated wavelength calibration using NIST-traceable standards.

• Advanced Spectral Acquisition & Analysis

Enables acquisition of absorbance, reflectance, fluorescence, and polarization spectra from sub-micron regions. Includes tools for baseline correction, peak fitting, spectral unmixing, and statistical evaluation.

• Integrated Imaging & Data Fusion

Supports simultaneous capture of high-resolution images and microspectra^™. Features image target selection, focus stacking, and 3D spectral mapping capabilities.

• Modular, Expandable Architecture

Compatible with CRAIC’s full suite of software plug-ins, including thin-film thickness measurement, colorimetry, 5D hyperspectral mapping, Raman analysis, and more.

• Data Export & Reporting Tools

Spectra and images can be exported in industry-standard formats (e.g., ASCII, TIF, JPG). Integrated report generation tools streamline documentation and archiving.

Supporting Research, Manufacturing, and Quality Control

Lambdafire^™ 2.0 provides scientists and engineers with the tools to extract maximum insight from complex samples in fields including:

• Semiconductor and display manufacturing
• Materials science and advanced coatings
• Forensics and pharmaceuticals
• Life sciences and bioimaging
• Coal and petrography

“Lambdafire^™ 2.0 represents the most sophisticated and flexible software platform we've ever developed,” said Dr. Paul Martin, President of CRAIC Technologies. “It’s designed not only to enhance the performance of our microspectrophotometers, but also to empower users with the control, customization, and analytical power needed to meet today’s demanding applications in science and industry.”

Availability

Lambdafire^™ 2.0 is now shipping with all new CRAIC microspectrophotometer systems and is available as an upgrade for many existing customers.