UV-visible-NIR, Fluorescence, Photoluminescence & Raman Microspectrophotometers

Photoluminescence Microspectrometers

Photoluminescence Microspectrometer: an instrument designed to measure the fluorescence, photoluminescence, and emission spectra of microscopic samples with excitation in the UV, visible and NIR regions.  The following links have more information:

	What is a Microspectrofluorometer? Science of Microspectrofluorometry Microspectrofluorometer Design How Microspectrofluorometers are Used 2030PV PRO™ Microspectrofluorometers 508PV™ Microscope Spectrofluorometers

Raman Microspectrometers

Raman Microspectrometer: an instrument designed to measure the Raman spectra of microscopic samples. The following links contain more information about CRAIC Technologies Raman microspectrometer solutions:

	The Science of Raman Microspectroscopy Raman Microspectrometer Design How a Raman Microspectrometer is Used Apollo M™ Confocal Raman Microspectrometer

UV & NIR Microscopes

UV-Vis-NIR Microscope: CRAIC Technologies UV-Vis-NIR microscope systems allow the user to image items that cannot be seen with commonly available microscopes that only cover the visible range. This capability is useful in diverse fields such as a protein crystal analysis for drug discovery to contamination control for semiconductors to interior circuits in bonded silicon devices. The following links contain more information:

	UV-visible-NIR Microscope Design Why Use a UV microscope? The CRAIC UV Microscope

Petrography

Vitrinite reflectance, point counting and fluorescence of coal, coke and petroleum source rock with GeoImager™ Imaging Photometer for your microscope CoalPro™ vitrinite reflectance software for your microspectrometer

Glass Refractive Index Measurement

Glass Refractive Index Measurement: rIQ™ is the intelligent way for the forensic analysis of the refractive index of glass and glass-like material fragments.

Thin Film Thickness

Thin Film Thickness Measurement: Advanced microspot thin film thickness measurement featuring film thickness mapping of greater than 300 mm wafers

Thin Film Thickness Measurement of Microscopic areas 2030PV PRO™ UV-Visible-NIR Microspectrophotometer 2030XL PRO™: Microspot Measurements on Very Large Samples 508PV™ Microscope Spectrometer

More Innovations

• Universal C-Mount
• Laser Illumination
• UV-Visible-NIR Polarization
• Spectroscopy Standards
• Thin Film Thickness Measurement
• Instrument Automation

• Universal C-Mount
• Laser Illumination
• UV-Visible-NIR Polarization
• Spectroscopy Standards
• Thin Film Thickness Measurement
• Instrument Automation

Universal C-Mount

Universal C-Mount Adapter: An adapter designed to attach cameras and spectrophotometers to a microscope photoport so that they are parfocal and parcentral with the eyepieces.

Laser Illumination

Laser Illumination for Microspectroscopy: Add laser illumination to your CRAIC Technologies microscope or microspectrometer quickly and easily.  Featuring alignment mechanisms and capable of working with UV, visible and NIR lasers, the option has applications in many fields.

UV-Visible-NIR Polarization

UV-visible-NIR Polarization Microspectroscopy: Both transmission and reflectance polarizers and analyzers are offered for the UV-visible-NIR spectral range.  Designed for use with CRAIC Technologies microscopes and microspectrometers, they are housed in both rotating and fixed holders.

Spectroscopy Standards

Microscope Spectrophotometer Standards: Standards designed for use with microspectrometers and traceable to Standard Reference Materials.

Thin Film Thickness Measurement

Film Thickness Measurement: Advanced microspot thin film thickness measurement with CRAIC FilmPro™ software and CRAIC microspectrometers.

Instrument Automation

Automation Packages: Automate microspectral and image analysis, including 3D mapping, with the addition of CRAIC Technologies automation solutions. Ideal for industrial applications that require repetitive measurements.

Applications

Applications are numerous: research in materials science, chemistry and physics, forensic science, semiconductor metrology, quality control of optics and flat panel displays, vitrinite coal testing, protein crystals, vision research and more here.

Services

• Technical Support
• Service Contracts
• Standards Recertification
• Preventative Maintenance
• Instrument Relocation Services